AI-Powered Fabric Defect Detection: Automating Textile Quality Control
Our AI-powered solution automates textile quality control using deep learning and computer vision, offering quick and accurate defect detection in fabrics.
In-Scope Features:
Image Upload: Users can upload fabric images for automated analysis.
Defect Detection: A pre-trained MobileNetV2 model detects fabric defects.
Visualization: Grad-CAM heatmaps visually highlight potential defect areas.
Binary Classification: The system classifies images as either "Defect Detected" or "No Defect Detected."
Confidence Score: The model provides a confidence score for the prediction.
Explanation: Results are explained based on the heatmap outputs.
Contextual Analysis: The system suggests potential causes of defects.
Recommendations: Provides generic suggestions for addressing the detected defects.
User Interface: A web interface built using Streamlit makes it easy to use.
Out of Scope:
Multi-class Defect Classification: Does not identify specific defect types.
Real-time Processing: Not designed for production line analysis.
Manufacturing System Integration: This is a standalone solution with no system integration.
Custom Model Training: Uses a pre-trained model without textile-specific training data.
Historical Data Tracking: No storage or analysis of past defect data.
Automated Reporting: No comprehensive report generation.
Mobile Application: Limited to a web-based interface.
Future Opportunities:
Multi-class Classification: Identify specific fabric defect types.
Custom Dataset: Train the model on textile-specific data to improve accuracy.
Real-time Analysis: Integrate camera feeds for production line analysis.
Integration: Develop APIs for manufacturing and ERP system integration.
Advanced Reporting: Provide detailed analytics and reports for quality control.
Continuous Learning: Implement a feedback loop to continuously improve the model.
Mobile App: Develop a mobile application for on-the-go inspections
During the development of our AI-Powered Fabric Defect Detection system, we faced several hurdles:
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